Researchers have designed a system capable of simultaneously measuring hundreds of radio frequency identification (RFID) tags and rapidly testing new RFID tag prototypes.
“This testbed allows us to measure the signal strength of tags hidden behind other tags and to rapidly test unique antenna configurations and multiple antennas without actually constructing new tags for each experiment,” said Gregory Durgin, an assistant professor in the Georgia Institute of Technology’s School of Electrical and Computer Engineering.
RFID testbed measures multiple tags at once and rapidly assesses new antenna designs